Filtro 4.5nm SII EDGE Antlia Filter 1.25" montato in cella
Brands:
Filtro 4.5nm SII EDGE Antlia Filter 1.25" montato in cella
- Basic Substrate: Optical, Single / Non-glued substrate
- Filter Thickness: 2mm+/-0.05mm for 1.25”
- FWHM (Full width at half maximum): 4.5nm
- CWL (Central Wavelength): 671.6nm
- Peak Transmission: >90%
- Blocking: > 5 OD(0.001% out of band blocking) @ 300-1000nm
- Surface Quality: S/D (scratch/dig)= 60/40 (Refer to MIL-O-13830)
- Transmitted Wavefront: Lambda/4 or better. Parallelism: less than 30 arcsec
Stato | Nuovo |
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